Course title: Bioengineering 493/593 – Advanced Surface Analysis, Winter 2013 (Chemical Engineering 493/593)
Instructor: D.G. Castner (Office: MolES 225, Phone: 206-543-8094 e-mail: firstname.lastname@example.org)
Office hours: by appointment
Lectures: Wednesday, Friday – BNS 203, 12:30-1:50pm
Reference Text (Optional): Surface Analysis: The Principal Techniques, J.C. Vickerman, Editor, 1997 (1st edition) or 2009 (2nd edition)
UW Catalog Description: Latest advances in surface analysis instrumentation and methodology, including advanced methods in Biorecognition AFM, Surface Plasmon Resonance, X-ray Photoelectron Spectroscopy, Sum Frequency Generation Spectroscopy, Time-of-flight Secondary Ion Mass spectrometry, Multivariate Analysis.
Prerequisites: Bioen 492/592 or Cheme 458/558.
Learning Objectives: By the end of this course, students should be aware of the latest experiments that can be done and information that be provided by surface analysis methods. They should also be able to analyze and discuss the results obtained from advanced surface analysis instrumentation and methods.
Student Presentations: Graduate students will each do one 20-minute critique of literature papers. The range of topics for the critiques are the same as those covered during lectures (see above). Selection of a specific critique topic must be approved in advance by the instructor. An electronic copy of slides used for the presentation must be e-mailed to the instructor before 5pm on the day of the presentation.
Midterm Exams: Two mid-term exams will be given covering the topics presented in the lectures.
Class Participation: All students are expect to be active in the discussion of material presented in lecture and participate in the question and answer sessions associated with each student presentation.
Final Paper: Instead of the final exam, each student will submit a paper (8 pages for undergraduates and 12 pages for graduates) using 1” margins, 1.5 line spacing and 12 point font on an advanced surface analysis technique. The topic for this paper must be approved by the instructor. The advance surface analysis method discussed in the paper can’t be one the student is currently using in their research projects, but it can be one the students are considering to use in the future. Papers are to be submitted by the final exam time period for this course.
|Graduate Grading:||Oral Critique
|Midterm Exams (50 pts each)||100|
|maximum possible||400 points|
|Undergraduate Grading:||Final Paper
Midterm Exams (50 pts each)
|Wed, Jan 9||High Resolution XPS|
|Fri, Jan 11||Biorecognition AFM|
|Wed, Jan 16||Optical Reflection Methods for Thin Film Characterization (Patrick Koelsch)|
|Fri, Jan 18||Surface Plasmon Resonance: Kinetics & Biosensing|
|Wed, Jan 23||Non-linear optical methods: Fundamentals & Instrumentation (Patrick Koelsch)|
|Fri, Jan 25||Applications of NLO Spectroscopy & Imaging (Patrick Koelsch)|
|Wed, Jan 30||Surface Modification Methods (Buddy Ratner)|
|Fri, Feb 1||XPS Imaging|
|Wed, Feb 6||Mid-term Exam #1|
|Fri, Feb 8||Student Oral Critiques|
|Wed, Feb 13||XPS Analysis of Supported Nanoparticles|
|Fri, Feb 15||XPS Analysis of Biomedical Nanoparticles|
|Wed, Feb 20||Multivariate Analysis: Fundamentals (Dan Graham)|
|Fri, Feb 22||Multivariate Analysis: Spectral Processing (Dan Graham)|
|Wed, Feb 27||Multivariate Analysis: Image Processing (Dan Graham)|
|Fri, Mar 1||Polyatomic ToF-SIMS|
|Wed, Mar 6||ToF-SIMS Depth Profiling|
|Fri, Mar 8||Student Oral Critiques|
|Wed, Mar 13||Mid-term Exam #2|
|Fri, Mar 15||Student Oral Critiques|
|Thur, Mar 21||Final paper due by noon|