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Ohuchi:![]() |
The research will be carried out at the
University of Washington in the existing laboratories of Profs. Ohuchi
in 216 Roberts Hall, Wilcox Annex Laboratory, 44 Johnson Hall and
shared Nanostructure Analysis Facility in B009 Physics-Astronomy
Building. All three labs have molecular beam epitaxy (MBE) capability
in UHV chambers connected by UHV transfer to analytical chambers, as
described below. The labs also have fume hoods and student work
stations. Growth and Surface Analysis System I (216 Roberts Hall)An ultra-high vacuum system consisting of three interconnected chambers (growth, sample prep and analysis) and a load-lock is located in 216 Roberts Hall. In the growth chamber, which is equipped with a CCD reflection high-energy electron diffraction (RHEFD) system, a heating stage, Knudsen cell evaporation sources including GaSe, As, and Se. We expect to build and install a separate Ga source as part of this proposal. In the sample preparation chamber, the sample may be heated to a high temperature. Auger electron spectroscopy (AES) and X-ray photoemission spectroscopy (XPS) are available using a cylindrical mirror analyzer in the analysis chamber. Wilcox Annex LaboratoryNewly established laboratory dedicated for electrical transport measurements, optical reflection and transmission, photoluminescence, and other optical measurements. Tunable laser sources for photoluminescence measurement. Raman Scattering and Photoluntnescence System (Johnson Hall)An ISA S-3600 high resolution Raman spectrometer equipped with an INOVA-300 Ar laser is available for use. A liquid nitrogen cooled dewar may be attached for measurements below room temperature. Nanostructure Analysis Facility (B009 Physics-Astronomy Building) This is Omicron variable temperature, ultrahigh
vacuum, scanning force and tunneling microscope, with capabilities for
simultaneous growth and measurement at non-ambient temperature
(30.1000K AFM; 30-1500K STM), arrived in January 2001. The system is
connected by U1-!V to an analytical chamber with XPS, LEED and ion
scattering spectroscopy capability and an additional sample preparation
chamber. |
Others: Francois
Baneyx |