XRD- Siemens D 5000

The D5000 diffractometer is available on a limited basis for those who need to do measurements that are not possible on the Philips XRD. For example, reflectometry measurements, decoupled, rocking curve measurements, or glancing angle measurements. This instrument resides in the Ohuchi lab facility and access is subject to the research needs of that group. The Jade analysis software is also available for use with the data file obtained from the D5000
Technical information

X-ray Source: 40kV/40mA tube source. Cu K-alpha radiation (1.54 A).
X-ray optics: Parabolic multilayer mirror (Goebel Mirror). Available detector-side graphite monochromator.
Sample stage: Adjustable height vacuum chuck.

Capabilities: Normal-coupled theta - 2 theta scan (0-100 degrees 2Theta). Decoupled rocking curve or detector scans. Out of plane glancing incidence X-ray Diffraction. X-ray reflectometry.

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