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Nanoscience on the tip a workshop in scanning probe microscopy |
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Motivation, Objective and Preface
Organization of the 2007 SPM Workshop
NUE UNIQUE Partners and Sponsors
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Laboratory Unit Descriptions and Assignments LAB UNIT 1: Scanning Force Microscopy & Nanolithography Background: Scanning Probe Microscopy and Dip-Pen Nanolithography.
LAB UNIT 2: AC-Mode SFM and Electrostatic Force Microscopy Background: AC mode force microscopy and electrostatic force microscopy.
LAB UNIT 3: Force Spectroscopy Analysis Background: Dipole-dipole interactions and capillary forces.
LAB UNIT 4: Force Modulation Microscopy Background: Contact mechanics and viscoelastic phenomena of polymers.
LAB UNIT 5: Scanning Tunneling Microscopy Background: Scanning
Probe Microscopy and Dip-Pen Nanolithography. |
Extracted Background Material
Introduction
to Scanning Tunneling Microscopy
(http://depts.washington.edu/nanolab/NUE_UNIQUE/Background/STM.pdf)
With the development of quantum mechanics
in the early 20th century, mankind’s perception of nature was
stretched to a great degree leading to new axioms, and the recognition of the
particle-wave dualism. It was found that particles with small masses such
electrons could interchangeably be described as waves or as corpuscular
objects. With the wave character of matter, particles exhibit a probability of
existence at places, where they can classically not exist. One of these
phenomena is the tunnel effect, which describes the ability of an electron to
tunnel through a vacuum barrier from one electrode to the other. Since 1960
tunneling has been extensively studied experimentally. This led in 1981 to the
first microscopic tool with which atoms could be observed in real space – the
scanning tunneling microscopy. In addition to the atomic resolution imaging
capability of STM, tunnel currents could be studied with this tool in a
spectroscopy manner providing insight into the local density of state (LDOS) of
material surfaces.
Introduction
to Scanning Force Microscopy
(http://depts.washington.edu/nanolab/NUE_UNIQUE/Background/AFM.pdf)
Scanning Force Microscopy (SFM), also
known as Atomic Force Microscopy (AFM), is today’s most prominent scanning
probe method. It is a surface imaging technique that images both conductive and
nonconductive surfaces by literally “feeling the surface”, i.e. measuring the
force between a surface and an ultra sharp tip (typically 10 nm in radius).
AC
- Scanning Force Microscopy
(http://depts.washington.edu/nanolab/NUE_UNIQUE/Background/AC-AFM.pdf)
Contact
mode, non-contact mode, and intermittent-contact mode scanning probe microscopy
(SPM) all use short range van der Waals
forces to probe the topographic features of a sample. However, if we move the scanning probe
further away from the surface (10-50 nm), we can examine longer range forces,
such as electrostatic and magnetic forces.
Intermittent-contact mode and electrostatic force microscopy (EFM) make
use of the changes of the motion of an oscillating tip to produce images.
Non-Covalent
Short-Range Interactions
(http://depts.washington.edu/nanolab/NUE_UNIQUE/Background/Interactions.pdf)
As
technology moves more towards miniaturization in novel product developments, it
is imperative to integrate interfacial interactions into design strategies.
Consequently, interfacial forces have to be explored. Interfacial forces are on
the order of 10-6 to 10-10 N, strong enough, for
instance, to freeze gears in micro-electrical mechanical systems (MEMS), to
affect the stability of colloidal system, or to wipe out magnetically stored
data information in hard drives. There are multiple ways of exploring the
strength of interfacial interactions, one of which is by force spectroscopy, also
known as force-displacement (FD) analysis. The FD analysis involves a nanometer
sharp scanning force microscopy (SFM) tip that is moved relative to the sample
surface in nanometer to micrometer per second, as illustrated at end of this
document in Figure 10. Before we discuss FD analysis, we first discuss
interaction forces, particularly weak interactions between molecules and solids.
Contact
Mechanics and Aspects of
Polymer Science and Rheology
(http://depts.washington.edu/nanolab/NUE_UNIQUE/Background/Contact_Mechanics.pdf)
Physical
property measurements (e.g., mechanical properties, surface tension, friction,
and phase and structural transition properties) involving scanning force
microscopy (SFM) have been particularly successful for soft organic materials.
Two science disciplines that have been of great value in analyzing SFM data are
Contact Mechanics and Polymer Science and Rheology. Contact
Mechanics focuses on the material responses to mechanical deformations at the
surface, which involves besides the near surface material properties also the
probe geometry, the local pressure and adhesion. More detailed insight into soft
organic material responses to stresses on a macroscopic but also molecular
scale is obtained from Polymer Science and Rheology.
Protein
Surface Adsorption Kinetics
(WEB Address
Under Construction)
One
of the foremost challenges involving medical implants is to gain control over the
adsorption kinetics of proteins. There are currently severe control limitations
due to the body’s complex biochemical response mechanisms to foreign surfaces. The
design of proper biomaterials and bioactive surfaces requires a fundamental
understanding of the bio-response mechanism from the body and its ultimate
effects at the interface of the material surface. Real time fluid-mode AFM
imaging provides the opportunity to study the reaction kinetics of proteins,
and thus, offers important input towards (a) the design of appropriate bio-compatible
interfaces, but also (b) the engineering of genetically modified biomaterials
(e.g., polypeptides).