NTUF Research Tool Inventory

Dimpling Grinder

Prethins TEM samples up to 200um thick in preparation for ion polishing.  This mechanical grinder thins only the central area of a TEM sample and leaves the outer edge thick enough to handle with tweezers.  The area of interest can be precisely positioned at center using a 40X optical microscope.  Final thickness at the center of the sample is just a few micron and can be quickly ion polished to remove scratches.


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