Many modern technologies including photonics, electronic devices, advanced materials, miniaturized bio-medical tests etc. are based on application of thin films. Ellipsometry is used for determination of thicknesses and optical parameters of thin films and multilayers.
The M-2000 Spectroscopic Ellipsometer is the perfect combination of speed and
accuracy. Measurements covering the entire spectral range from deep ultraviolet to
near infrared are accomplished in seconds–making the M-2000 ideal for a wide range
Spectral Range: 210-1700nm
Scan Speed: < 10 s for collection of entire spectral range