This facility provides a range of materials and surface characterization tools including:
FEI Sirion Scanning Electron Microscope, FEI Technai Transmission Electron Microscope, Bruker D8 Discover with GADDS XRD, Dimension 3110 Scanning Probe Microscope, Multimode Atomic Force Microscope/Scanning Tunneling Microscope, Zeiss LSM 510 Laser Scanning Confocal Microscope, Renishaw Raman Microscope, Biacore Surface Plasmon Resonance system, Woollam M-2000 Spectroscopic Ellipsometer, and fabrication and sample preparation tools and techniques: e-Beam Lithography (on the Sirion SEM), Fischione 1050 TEM Ion Mill, Dimpling Grinder and Ultrasonic disc Cutter, Gatan Solarus 950 Plasma Cleaner, Leica EM UC6 Ultramicrotome, Critical Point Dryer, diamond saw, sputtering, gold evaporation. Users are trained here by PhD-level staff scientists.
