NTUF Research Tool Inventory

Examination Tools

FEI Sirion SEM
FEI Sirion SEM
Mutimode AFM
Multimode AFM/STM
Dimension 3100 SPM
Dimension 3100 SPM

TEM
FEI Tecnai TEM

Bruker D8 Discover with GADDS XRD system
Bruker D8 Discover with GADDS XRD system

Woollam M-2000 Spectroscopic Ellipsometer e
Woollam M-2000 Spectroscopic Ellipsometer
Zeiss LSM 510NLO
Zeiss LSM 510NLO
Renishaw Raman Microscope
Renishaw Raman Microscope
Biacore
Biacore SPR
 

 

 

Sample Preparation Tools

Microtome
Leica EM UC6
Renishaw Raman Microscope
Fischione 1050 TEM Ion Mill
plasma cleaner
Gatan Solarus 950

 

 

 

 

Fabrication Tools

Rapid Prototyping
Rapid Prototyping
Soft Lithography
Soft Lithography
E-Beam Lithography
E-Beam Lithography

OpAL

Oxford OpAL ALD

mask writer

Heidelberg µPG 101

 

 
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