Qualifying and Quantifying Order in Semiconducting Polymers

Chad Snyder
NIST


Abstract

Crystallinity is often used as a key metric in structure/performance studies of OTFT devices. However, significant differences can exist between low crystallinity polymers and liquid crystalline polymers, which can often be confused for one another. Calorimetry is frequently employed to understand these materials; however, the ease of use and simplicity of analysis oftentimes results in completely erroneous conclusions being drawn. We present results from our laboratory showing some pitfalls in delineating between liquid crystalline and low crystallinity polymers as well as in quantifying absolute crystallinity, and subsequently provide rigorous, and relatively simple, means for circumventing these pitfalls.