For SPM measurements a sharp probe tip is scanned across the surface using piezoelectrics. The response of the tip to the surface (change in height, frequency of oscillation, etc.) is used to generate a 3D image of the surface.
<\/p>\n\n\n\n
SPM Capabilities<\/strong> For more information about AFM, see the Molecular Analysis Facility (MAF) Tool pages here:<\/strong> For SPM measurements a sharp probe tip is scanned across the surface using piezoelectrics. The response of the tip to the surface (change in height, frequency of oscillation, etc.) is used to generate a 3D image of the surface. SPM Capabilities-Imaging-Contact Mode-Friction Imaging-Acoustic AC Mode \/ Phase Imaging (Agilent\u2019s equivalent of Tapping Mode TM)-Magnetic ACContinue reading “SPM”<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-459","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/depts.washington.edu\/nesacbio\/wp-json\/wp\/v2\/pages\/459","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/depts.washington.edu\/nesacbio\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/depts.washington.edu\/nesacbio\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/depts.washington.edu\/nesacbio\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/depts.washington.edu\/nesacbio\/wp-json\/wp\/v2\/comments?post=459"}],"version-history":[{"count":2,"href":"https:\/\/depts.washington.edu\/nesacbio\/wp-json\/wp\/v2\/pages\/459\/revisions"}],"predecessor-version":[{"id":486,"href":"https:\/\/depts.washington.edu\/nesacbio\/wp-json\/wp\/v2\/pages\/459\/revisions\/486"}],"wp:attachment":[{"href":"https:\/\/depts.washington.edu\/nesacbio\/wp-json\/wp\/v2\/media?parent=459"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}
-Imaging
-Contact Mode
-Friction Imaging
-Acoustic AC Mode \/ Phase Imaging (Agilent\u2019s equivalent of Tapping Mode TM)
-Magnetic AC Mode (MAC) \/ Phase Imaging
-Pulsed Force Mode (PFM)
-Force Spectroscopy
-Force Distance Curves
-Amplitude Distance Curves
-When used in combination with XPS and ToF-SIMS we are able to verify any surface modification technique used in force spectroscopy experiments.<\/p>\n\n\n\n
\n\n\n\n
Link to MAF page about the Asylum Research Cypher AFM<\/a>
Link to MAF page about the Bruker ICON AFM<\/a>
Link to MAF page about the Molecular Vista PiFM<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"