NTUF Research Tool Inventory

Characterization Tools

FEI Tecnai TEM
FEI Tecnai TEM
FEI Sirion SEM with EBL and EDS
FEI Sirion SEM with EBL and EDS
Bruker D8 Discover with GADDS 2-D XRD system
Bruker D8 Discover with GADDS 2-D XRD system
Renishaw InVia Raman Microscope
Renishaw InVia Raman Microscope
Zeiss LSM 510 NLO Laser Scanning Confocal Microscope
Zeiss LSM 510 NLO Laser Scanning Confocal Microscope
Bruker Dimension 3100 AFM
Bruker Dimension 3100 AFM
Woollam M-2000 Spectroscopic Ellipsometer
Woollam M-2000 Spectroscopic Ellipsometer
Biacore T100 Surface Plasmon Resonance
Biacore T100 Surface Plasmon Resonance
     

Fabrication and Sample Preparation Tools

FEI XL830 Dual Beam FIB/SEM
FEI XL830 Dual Beam FIB/SEM
Leica EM UC6 Ultramicrotome
Leica EM UC6 Ultramicrotome
Fischione 1050 TEM Ion Mill
Fischione 1050 TEM Ion Mill
Gatan Solarus 950 Plasma Cleaner
Gatan Solarus 950 Plasma Cleaner
Fischione Dimpling Grinder
Fischione Dimpling Grinder
Fischione Ultrasonic Disc Cutter
Fischione Ultrasonic Disc Cutter

EBL - on the Sirion SEM
SPI Sputter Coater
Edwards Gold Evaporator
Critical Point Dryer
Spin Coater
Ted Pella Grinder Polisher
Diener Plasma Cleaner
Diamond Saw

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