Brison, J.; Robinson, M. A.; Benoit, D. S. W.; Muramoto, S.; Stayton, P. S.; & Castner, D. G. (2013). TOF-SIMS 3D Imaging of Native and Non-Native Species within HeLa Cells. Anal Chem, 85(22), 10869-10877.
Muramoto, S.; Graham, D. J.; Wagner, M. S.; Lee, T. G.; Moon, D. W.; & Castner, D. G. (2011). ToF-SIMS Analysis of Adsorbed Proteins: Principal Component Analysis of the Primary Ion Species Effect on the Protein Fragmentation Patterns. Journal of Physical Chemistry C, 115(49), 24247-24255.
Silvia, F.; Ristori, S.; Mazzuoli, S.; Tognazzi, A.; Leach-Scampavia, D.; Castner, D. G.; & Rossi, C. (2006). ToF-SIMS and PCA studies of Seggianese olives and olive oil. Colloids and Surfaces a-Physicochemical and Engineering Aspects, 279(1-3), 225-232.
Foster, R. N.; Harrison, E. T.; & Castner, D. G. (2016). ToF-SIMS and XPS Characterization of Protein Films Adsorbed onto Bare and Sodium Styrenesulfonate-Grafted Gold Substrates. Langmuir, 32(13), 3207-3216.
Foster, R. N.; Harrison, E. T.; & Castner, D. G. (2016). ToF-SIMS and XPS Characterization of Protein Films Adsorbed onto Bare and Sodium Styrenesulfonate-Grafted Gold Substrates. Langmuir, 32(13), 3207-3216. PMCID: 4821661
Samuel, N. T. & Castner, D. G. (2004). ToF-SIMS characterization of hybridization onto self-assembled single-stranded DNA monolayers. Applied Surface Science, 231, 397-401.
Robinson, M. A.; Graham, D. J.; & Castner, D. G. (2012). ToF-SIMS Depth Profiling of Cells: z-Correction, 3D Imaging, and Sputter Rate of Individual NIH/3T3 Fibroblasts. Anal Chem, 84(11), 4880-4885.
Brison, J.; Muramoto, S.; & Castner, D. G. (2010). ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single-Beam and Dual-Beam Analysis. Journal of Physical Chemistry C, 114(12), 5565-5573.
Muramoto, S.; Brison, J.; & Castner, D. (2011). ToF-SIMS Depth Profiling of Trehalose: The Effect of Analysis Beam Dose on the Quality of Depth Profiles. Surf Interface Anal, 43(1-2), 58-61. PMCID: 3194093
Muramoto, S.; Brison, J.; & Castner, D. G. (2011). ToF-SIMS depth profiling of trehalose: The effect of analysis beam dose on the quality of depth profiles. Surface and Interface Analysis, 43(1-2), 58-61.