Analysis of Poly(amino acids) by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Citation

Samuel, Newton T.; Wagner, M. S.; Dornfeld, K. D.; & Castner, David G. (2002). Analysis of Poly(amino acids) by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS). Surface Science Spectra, 8(3), 163-184.

Abstract

This study presents the static time-of-flightsecondary ion mass spectrometry (TOF-SIMS) spectra of 15 poly(amino acids),solvent or spin cast onto either mica or silicon substrates. These poly(amino acid)spectra are useful for interpreting the complex static TOF-SIMS spectra obtained from adsorbed protein films and peptide-functionalized surfaces. Previous studies have reported poly(amino acid)spectra acquired with a quadrupoleSIMS instrument. The spectra obtained with a TOF-SIMS instrument in this study have significantly higher sensitivity and mass resolution, which are essential for producing good, high-quality reference spectra.

Keyword(s)

Acids
Mass spectra
proteins
Quadrupoles
Secondary ion mass spectroscopy
silicon
Solvents
Spectrum analysis
Time of flight mass spectrometry

Reference Type

Journal Article

Secondary Title

Surface Science Spectra

Author(s)

Samuel, Newton T.
Wagner, M. S.
Dornfeld, K. D.
Castner, David G.

Year Published

2002

Date Published

1039392000

Volume Number

8

Issue Number

3

Pages

163-184

ISSN/ISBN

1055-5269

DOI

10.1116/11.20020301