Citation
Baer, D. R.; Gaspar, D. J.; Nachimuthu, P.; Techane, S. D.; & Castner, D. G. (2010).
Application of Surface Chemical Analysis Tools for Characterization of Nanoparticles.
Analytical and bioanalytical chemistry, 396(3), 983-1002.
Abstract
The important role that surface chemical analysis methods can and should play in the characterization of nanoparticles is described. The types of information that can be obtained from analysis of nanoparticles using Auger electron spectroscopy (AES); X-ray photoelectron spectroscopy (XPS); time of flight secondary ion mass spectrometry (TOF-SIMS); low energy ion scattering (LEIS); and scanning probe microscopy (SPM), including scanning tunneling microscopy (STM) and atomic force microscopy (AFM), are briefly summarized. Examples describing the characterization of engineered nanoparticles are provided. Specific analysis considerations and issues associated with using surface analysis methods for the characterization of nanoparticles are discussed and summarized, along with the impact that shape instability, environmentally induced changes, deliberate and accidental coating, etc., have on nanoparticle properties.
Reference Type
Journal Article
Secondary Title
Analytical and bioanalytical chemistry
Author(s)
Baer, D. R.Gaspar, D. J.Nachimuthu, P.Techane, S. D.Castner, D. G.
Year Published
2010
Volume Number
396
Issue Number
3
Pages
983-1002
ISSN/ISBN
1618-2642
DOI
10.1007/s00216-009-3360-1
