Quantitative time-of-flight secondary ion mass spectrometry for the characterization of multicomponent adsorbed protein films

Citation

Wagner, M. S.; Shen, M.; Horbett, T. A.; & Castner, David G. (2003). Quantitative time-of-flight secondary ion mass spectrometry for the characterization of multicomponent adsorbed protein films. Applied Surface Science, 203–204, 704-709.

Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is ideal for the characterization of adsorbed proteins due to its chemical specificity and surface sensitivity. We have employed ToF-SIMS and multivariate analysis to determine the surface composition of adsorbed protein films from binary mixtures, blood serum, and blood plasma. Good correlation between ToF-SIMS data and independent radiolabeling studies was achieved for binary mixtures, though these results depended on the substrate. Qualitative insight into the composition of the serum and plasma protein films was obtained via comparison to standard single protein film spectra. ToF-SIMS and multivariate analysis were able to measure the surface composition of multicomponent adsorbed protein films.

Keyword(s)

Multicomponent
multivariate analysis
protein adsorption
tof-sims

Reference Type

Journal Article

Secondary Title

Applied Surface Science

Author(s)

Wagner, M. S.
Shen, M.
Horbett, T. A.
Castner, David G.

Year Published

2003

Date Published

1042588800

Volume Number

203–204

Pages

704-709

DOI

10.1016/s0169-4332(02)00795-x