P3HT:PCBM

Submicrosecond Time Resolution Atomic Force Microscopy for Probing Nanoscale Dynamics

We propose, simulate, and experimentally validate a new mechanical detection method to analyze atomic force microscopy (AFM) cantilever …

Rajiv Giridharagopal, Glennis E. Rayermann, Guozheng Shao, David T. Moore, Obadiah G. Reid, Andreas F. Tillack, David. J. Masiello, David Ginger