Citation
Wagner, M. S.; McArthur, S. L.; Shen, M. C.; Horbett, T. A.; & Castner, D. G. (2002). Limits of detection for time of flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS): detection of low amounts of adsorbed protein. Journal of Biomaterials Science-Polymer Edition, 13(4), 407-428.Abstract
Characterization of biomaterial surfaces requires analytical techniques that are capable of detecting a wide concentration range of adsorbed protein. This range includes detection of low amounts of adsorbed protein (<10 ng/cm(2)) that may be present on non-fouling biomaterials. X-ray Photoelectron Spectroscopy (XPS) and Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) are surface sensitive techniques capable of detecting adsorbed proteins. We have investigated the lower limits of detection of both XPS and ToF-SIMS on four model substrates each presenting unique challenges for analysis by XPS and ToF-SIMS: mica, poly(tetrafluoroethylene), allyl amine plasma polymer and heptyl amine plasma polymer. The detection limit for XPS ranged from 10 ng/cm(2) of fibrinogen (on mica) to 200 ng/cm(2) (on allyl amine plasma polymers). The detection limit for ToF-SIMS ranged from 0.1 ng/cm(2) of fibrinogen to 100 ng/cm(2), depending on the substrate and data analysis. Optimal conditions provided detection limits between 0.1 ng/cm(2) and 15 ng/cm(2) on all of the substrates used in this study. While both techniques were shown to be effective in detecting protein, the sensitivity of both XPS and ToF-SIMS was, shown to be dependent on substrate surface chemistry and the organization of the adsorbed protein film. This study specifically highlights the applicability of ToF-SIMS in the characterization of low level protein adsorption.Keyword(s)
Adsorptionalbuminbiomaterial surfacesfilmslimit of detectionPolymersprincipal component analysisprotein adsorptionquantitations-simssurface-plasmon resonancetof-simsxpsNotes
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Cited References Count:40