Citation
Rafati, A.; ter Veen, R.; & Castner, D. G. (2013). Low-energy ion scattering: Determining overlayer thickness for functionalized gold nanoparticles. Surface and Interface Analysis, 45(11), 1737-1741.Abstract
With the widespread use of engineered nanoparticles for biomedical applications, detailed surface characterization is essential for ensuring reproducibility and the quality/suitability of the surface chemistry to the task at hand. One important surface property to be quantified is the overlayer thickness of self-assembled monolayer (SAM) functionalized nanoparticles, as this information provides insight into SAM ordering and assembly. We demonstrate the application of high sensitivity low-energy ion scattering (HS-LEIS) as a new analytical method for the fast thickness characterization of SAM functionalized gold nanoparticles (AuNPs). HS-LEIS demonstrates that a complete SAM is formed on 16-mercaptohexadecanoic acid (C16COOH) functionalized 14 nm AuNPs. HS-LEIS also experimentally provides SAM thickness values that are in good agreement with previously reported results from simulated electron spectra for surface analysis of X-ray photoelectron spectroscopy data. These results indicate HS-LEIS is a valuable surface analytical method for the characterization of SAM functionalized nanomaterials. Copyright (c) 2013 John Wiley & Sons, Ltd.Keyword(s)
auger-electron-spectroscopybiologycharacterizationdeliveryflatgold nanoparticlesgrowthhs-leisNanotechnologyoverlayer thicknessray photoelectron-spectroscopyself-assembled monolayerssessasimulationsurfacesxpsNotes
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Cited References Count:25