Citation
Belsey, Natalie A.; Cant, David J. H.; Minelli, Caterina; Araujo, Joyce R.; Bock, Bernd; Brüner, Philipp; Castner, David G.; Ceccone, Giacomo; Counsell, Jonathan D. P.; Dietrich, Paul M.; Engelhard, Mark H.; Fearn, Sarah; Galhardo, Carlos E.; Kalbe, Henryk; Kim, Jeong Won; Lartundo-Rojas, Luis; Luftman, Henry S.; Nunney, Tim S.; Pseiner, Johannes; Smith, Emily F.; Spampinato, Valentina; Sturm, Jacobus M.; Thomas, Andrew G.; Treacy, Jon P. W.; Veith, Lothar; Wagstaffe, Michael; Wang, Hai; Wang, Meiling; Wang, Yung-Chen; Werner, Wolfgang; Yang, Li; & Shard, Alexander G. (2016).
Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS.
The Journal of Physical Chemistry C, 120(42), 24070-24079.
Reference Type
Journal Article
Secondary Title
The Journal of Physical Chemistry C
Author(s)
Belsey, Natalie A.Cant, David J. H.Minelli, CaterinaAraujo, Joyce R.Bock, BerndBrüner, PhilippCastner, David G.Ceccone, GiacomoCounsell, Jonathan D. P.Dietrich, Paul M.Engelhard, Mark H.Fearn, SarahGalhardo, Carlos E.Kalbe, HenrykKim, Jeong WonLartundo-Rojas, LuisLuftman, Henry S.Nunney, Tim S.Pseiner, JohannesSmith, Emily F.Spampinato, ValentinaSturm, Jacobus M.Thomas, Andrew G.Treacy, Jon P. W.Veith, LotharWagstaffe, MichaelWang, HaiWang, MeilingWang, Yung-ChenWerner, WolfgangYang, LiShard, Alexander G.
Year Published
2016
Date Published
1477526400
Volume Number
120
Issue Number
42
Pages
24070-24079
Publisher
American Chemical Society
ISSN/ISBN
1932-7447
DOI
10.1021/acs.jpcc.6b06713
