Materials Research Science and Engineering Centers  The National Science Foundation

Materials Characterization

Materials Characterization Laboratories provide scanned probe and electron microscopes facilities to characterize materials and devices that range from molecular, nano- to microscale. Characterization instrumentations provide the capabilities for imaging, diffraction, and spectroscopy. They include optical/fluorescent microsocpe (Wilcox 135, Sarikaya), confocal microscope (Nanotech Center), scanning probe microscopes - STM & AFM (Roberts 121, Sarikaya; Nanotech Center), scanning and transmission electron microscopes (Roberts 116 & 118, Sarikaya; Nanotech Center). In addition, NMR is available to GEMSEC through John Evans at New York University and Surface Characterization, Chemical Engineering Facilities.



Online Instrument Sign-up for Qualified Users:

Veeco Nanoscope IIIa with MMAFM
Park CP & Hysitron Triboscope
Nikon TE 2000 Microscope
Resource Scheduler (JSM 7000 SEM, Bruker, D8 Focus XRD, Philips EM420 TEM)