Materials Characterization

Materials Characterization Laboratories provide scanned probe and electron microscopes facilities to characterize materials and devices that range from molecular, nano- to microscale. Characterization instrumentations provide the capabilities for imaging, diffraction, and spectroscopy. They include optical/fluorescent microsocpe (Wilcox 135, Sarikaya), two-photon &anmp; confocal microscope (Nanotech Center), scanning probe microscopes - STM & AFM (Roberts 121, Sarikaya; Nanotech Center), scanning and transmission electron microscopes (Roberts 116 & 118, Sarikaya; Nanotech Center). In addition, NMR is available to GEMSEC through John Evans at New York University and Surface Characterization, Chemical Engineering Facilities.

 

SEM (JSM 7400, JEOL) (Supervisor: Sarikaya)	TEM (EM-002B, Topcon) with Imaging Filter (Model 678, Gatan) (Supervisor: Sarikaya)	SPM (Nanoscope IIIa & MMAFM, Veeco) (Supervisor: Sarikaya)