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Publications
1986-1979

 

Kannan M. Krishnan, P. Rez, G. Thomas, Y. Yokota and H. Hashimoto, "The combined effect of acceleration voltage and incident beam orientation on the characteristic x-ray production in thin crystals," Philosophical Magazine B53, 339-348 (1986)

R. Ramesh, Kannan M. Krishnan, E. Goo, G. Thomas, M. Okada and M. Homma, " Microstructure of Fe-Didymium-B magnets", J. Mag. Mag. Mat., 54-57, 563 (1986)

D.A. Ackland, U. Dahmen, R. Kilaas, Kannan M. Krishnan, C. Nelson, M.A. O'Keefe, W. Smith and J. Turner, "Recent transmission electron microscopy applications at NCEM," Journal of Metals 38, 19-24 (1986)

Kannan M. Krishnan, R. Gronsky and L. E. Tanner, "Determination of the composition of the icosahedral phase in rapidly solidified Al-Mn quasi-crystals at high spatial resolution," Scripta Metallurgica 20, 239-242 (1986)

Kannan M. Krishnan, R. S. Rai, G. Thomas, N. D. Corbin and J. W. McCauley, "Characterization of long period polytypoid structures in the Al2O3-AlN system by CBED and phase contrast microscopy," Materials Research Society Symposium, Boston, MA, Proceedings on Defect Properties and Processing of High-Technology Nonmetallic Materials 60, 211-218 (1986)

R. Gronsky, Kannan Krishnan and L.E. Tanner, "Structural regularity and imperfections in the icosahedral phase of the Al-Mn system", JOM- J. Min. Met. Mat. 37 (8): A74-A74 (1985)

Kannan M. Krishnan, P. Rez and G. Thomas, "Crystallographic site occupancy refinements in thin film oxides by channeling enhanced microanalysis," Acta Crystallographica B41, 396-405 (1985)

R. Gronsky, Kannan M. Krishnan and L. E. Tanner, "An electron microscopy study of the icosahedral phase in the aluminium-manganese system," Electron Microscopy Society of America, Proceedings 43, 34-35 (1985)

Kannan M. Krishnan, G. Thomas, Y. Yokota and H. Hashimoto, "Voltage and orientation dependence of characteristic x-ray production in thin crystals," Electron Microscopy Society of America, Proceedings 43, 414-415 (1985)

Kannan M. Krishnan, L. Rabenberg, R.K. Mishra and G. Thomas, "Site occupation of ternary elements in Sm2(Co,TM)17 compounds," Journal of Applied Physics 55, 2058-60 (1984)

T. R. Dinger, Kannan M. Krishnan, G. Thomas, M. I. Osendi and J. S. Moya, "Investigation of Zr02/Mullite solid solution by energy dispersive x-ray spectroscopy and electron diffraction," Acta Metallurgica 32, 1601-7 (1984)

Kannan M. Krishnan and G. Thomas, "A generalization of atom location by channelling enhanced microanalysis," Journal of Microscopy 136, 97-101(1984)

Kannan M. Krishnan, P. Rez, R.K. Mishra and G. Thomas, "Determination of specific site occupation of rare earth additions in Y1.7Sm0.6Lu0.7Fe5012 thin films by the orientation dependence of characteristic x-ray emissions," Materials Research Society Symposium, Boston, MA, Proceedings on the Electron Microscopy of Materials 31, 79-84 (1984)

Kannan M, Krishnan, P. Rez and G. Thomas, "Effect of voltage on the orientation dependence of electron-induced characteristic x-ray emissions," Proceedings of the VII International Conference on High Voltage Electron Microscopy, R. Fisher, R. Gronsky and K. H. Westmacott (eds.), 365-70 (1983)

F.F. Y. Wang, Kannan M. Krishnan, D.E. Cox and A.M. Reynolds, "Compositional and structural studies of a MnZn Ferrite under different processing conditions", J Appl. Phys. 52 (3): 2436-2438 1981

Kannan M. Krishnan, F.F.Y. Wang, A.M. Reynolds, "Effect of heat treatment on MnZn Ferrite", Cer. Soc. Bull., 59 (3): 379-379 1980

F. F. Y. Wang, S. Bhaduri, T. A. Baum and Kannan M. Krishnan, " Hot pressing of silicon," in Sintering Processes, G. C. Kuczynski (ed.), Materials Science Research 13, 289-94 (1979)