Kannan M. Krishnan, P. Rez, G. Thomas, Y. Yokota and
H. Hashimoto, "The combined effect of acceleration
voltage and incident beam orientation on the characteristic
x-ray production in thin crystals," Philosophical
Magazine B53, 339-348 (1986)
R. Ramesh, Kannan M. Krishnan, E. Goo, G. Thomas, M.
Okada and M. Homma, " Microstructure of Fe-Didymium-B
magnets", J. Mag. Mag. Mat., 54-57, 563 (1986)
D.A. Ackland, U. Dahmen, R. Kilaas, Kannan M. Krishnan,
C. Nelson, M.A. O'Keefe, W. Smith and J. Turner, "Recent
transmission electron microscopy applications at NCEM,"
Journal of Metals 38, 19-24 (1986)
Kannan M. Krishnan, R. Gronsky and L. E. Tanner, "Determination
of the composition of the icosahedral phase in rapidly
solidified Al-Mn quasi-crystals at high spatial resolution,"
Scripta Metallurgica 20, 239-242 (1986)
Kannan M. Krishnan, R. S. Rai, G. Thomas, N. D. Corbin
and J. W. McCauley, "Characterization of long period
polytypoid structures in the Al2O3-AlN system by CBED
and phase contrast microscopy," Materials Research
Society Symposium, Boston, MA, Proceedings on Defect
Properties and Processing of High-Technology Nonmetallic
Materials 60, 211-218 (1986)
R. Gronsky, Kannan Krishnan and L.E. Tanner,
"Structural regularity and imperfections in the
icosahedral phase of the Al-Mn system", JOM- J.
Min. Met. Mat. 37 (8): A74-A74 (1985)
Kannan M. Krishnan, P. Rez and G. Thomas, "Crystallographic
site occupancy refinements in thin film oxides by channeling
enhanced microanalysis," Acta Crystallographica
B41, 396-405 (1985)
R. Gronsky, Kannan M. Krishnan and L. E. Tanner, "An
electron microscopy study of the icosahedral phase in
the aluminium-manganese system," Electron Microscopy
Society of America, Proceedings 43, 34-35 (1985)
Kannan M. Krishnan, G. Thomas, Y. Yokota and H. Hashimoto,
"Voltage and orientation dependence of characteristic
x-ray production in thin crystals," Electron Microscopy
Society of America, Proceedings 43, 414-415 (1985)
Kannan M. Krishnan, L. Rabenberg, R.K. Mishra and G.
Thomas, "Site occupation of ternary elements in
Sm2(Co,TM)17 compounds," Journal of Applied Physics
55, 2058-60 (1984)
T. R. Dinger, Kannan M. Krishnan, G. Thomas, M. I. Osendi
and J. S. Moya, "Investigation of Zr02/Mullite
solid solution by energy dispersive x-ray spectroscopy
and electron diffraction," Acta Metallurgica 32,
Kannan M. Krishnan and G. Thomas, "A generalization
of atom location by channelling enhanced microanalysis,"
Journal of Microscopy 136, 97-101(1984)
Kannan M. Krishnan, P. Rez, R.K. Mishra and G. Thomas,
"Determination of specific site occupation of rare
earth additions in Y1.7Sm0.6Lu0.7Fe5012 thin films by
the orientation dependence of characteristic x-ray emissions,"
Materials Research Society Symposium, Boston, MA, Proceedings
on the Electron Microscopy of Materials 31, 79-84 (1984)
Kannan M, Krishnan, P. Rez and G. Thomas, "Effect
of voltage on the orientation dependence of electron-induced
characteristic x-ray emissions," Proceedings of
the VII International Conference on High Voltage Electron
Microscopy, R. Fisher, R. Gronsky and K. H. Westmacott
(eds.), 365-70 (1983)
F.F. Y. Wang, Kannan M. Krishnan, D.E. Cox and A.M.
Reynolds, "Compositional and structural studies
of a MnZn Ferrite under different processing conditions",
J Appl. Phys. 52 (3): 2436-2438 1981
Kannan M. Krishnan, F.F.Y. Wang, A.M. Reynolds, "Effect
of heat treatment on MnZn Ferrite", Cer. Soc. Bull.,
59 (3): 379-379 1980
F. F. Y. Wang, S. Bhaduri, T. A. Baum and Kannan M.
Krishnan, " Hot pressing of silicon," in Sintering
Processes, G. C. Kuczynski (ed.), Materials Science
Research 13, 289-94 (1979)