Role of the physical, chemical and
magnetic microstructure at relevant length scales
in determining the functional behavior of engineered
materials. A variety of scattering, imaging and spectroscopy
methods are used. These include a) Structural characterization
(x-ray reflectivity, small-angle x-ray scattering)
and microstructural investigations using advanced
transmission electron microscopy; b) Surface characterization
by scanning probe microscopy; c) Magnetic characterization
and imaging by neutron scattering (IPNS), x-ray magnetic
circular dichroism (ALS), photo-emission electron
microscopy (ALS), electron holography, Lorentz microscopy
and magnetic force microscopy
Personnel
All members of the research group.
Active Projects:
none
Completed Projects:
Acquisition of a Scanning
Probe Microscope system for research and education
in nanomagnetism and spinelectronics.
Funding: NSF/DMR (7/03-6/06)
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