Acquisition of
a Scanning Probe Microscope system for research
and education in nanomagnetism and spinelectronics.
Funding: NSF/DMR (7/03-6/06)
Project Summary:
We have acquired , installed and optimized a scanning
probe microscope (SPM) system with emphasis on
magnetic force microscopy, high-resolution nanomanipulation
& nanolithography and tunneling spectroscopy.
This instrument, with high speed, high-resolution
imaging and metrology features, is capable of
the entire range of SPM scanning techniques. Specifically,
it offers phase and frequency detection for enhanced
magnetic force microscopy (MFM) imaging of magnetic
domains, a high frequency MFM mode for imaging
magnetic fields and magnetic dissipation microscopy
in ambient conditions for mapping domain wall
motion. All of the above can be carried out, if
necessary, under applied fields (< 5,000 Oe)
without sample heating or vibrations. In addition,
it includes tunneling-AFM and conducting-AFM modes
to measure either electrical current (imaging)
or current-voltage characteristics (spectroscopy)
spatially, as a function of position. The instrument
also features a low lateral noise, closed-loop
feedback scanning head to achieve true nanoscale
positioning with superior linearity of scan. This
is critical for measurement of I-V characteristics
with sensitivity to the underlying magnetic domain
structures, high-definition nanolithography and
precision manipulation of nanoscale objects. The
SPM system also allows flexible access to electronics
hardware and signals for custom experiments. The
acquisition of such a versatile SPM and the application
of its imaging, manipulation, lithography and
spectroscopy techniques to the novel structures,
materials and devices designed in our laboratory
qualitatively and creatively enhances both our
education and research activities. Specifically,
it provides significant impetus to ongoing projects
on self-assembled nanocrystals arrays (NSF/DMR),
exchange bias in atomically-engineered thin film
heterostructures (DoE/BES) and magnetic oxide
semiconductors for silicon based spintronics (NSF/ECS).
It will also complement efforts in micromagnetic
imaging/modeling and support exploratory projects
on spin-resolved quantum conductance, controlled
domain wall scattering in exchange-spring magnetic
thin film structures and Soft-lithography: nanostructures
and hybrid materials. This instrument is also
integrated into the teaching, education and training
of graduate and undergraduate students in the
areas of magnetism, mesoscale engineering and
spinelectronics, and enrolled in the departments
of materials science, physics and chemistry as
well as the interdisciplinary Ph.D. program in
Nanotechnology at UW.
Recent presentations:
Magnetism and Microstructure
at Relevant Length Scales: Complementary Measurements
with Electron and Photon Probes
Invited talk at INTERMAG meeting, Amsterdam, April
2002
